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Thickness Measurements of Curved Multi-Layered Polymer System Using Ultrasonic Pulse-Echo Method

机译:超声脉冲回波法测量弯曲多层聚合物体系的厚度

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摘要

The problem of the measurement of the thickness of the individual acoustically thin layers in multilayered structures has received considerable attention. In most cases, the difficulties of the measurements are due to the multiple reflection from the boundaries; hence the problem is usually solved in the frequency domain where the resonance structure of the frequency response is analyzed [1]. In the case of polymer structures the problem of the inversion of the ultrasonic data for the thickness of all layers is complicated by the high ultrasonic absorption and weak reflection from the internal boundaries. The other difficulty is the curvature of the specimen affected by the measurement [2]. The difficulties in carrying out such characterizations stem from the fact that the received signal is dependent not only on the acoustic properties of the layers, but also on the orientation, shape, surface properties, location and dimensions of the interfaces [3]. Distortion of the ultrasonic beam will take place if the interface is curved within the ultrasonic beam width. This distorts the geometry of the displayed structure, smears the resolution, and in the extreme case, can rise to duplicate image artifacts [4]. In the inspection of objects with a curved surface, the pulse interacts with complicated environments, the pulse spectral decomposition and synthesis is inapplicable because of difficulties associated with the response to each spectral component. Therefore, the interface between the different high absorptive layers in multilayered polymer composite, are not easy to observe and measure. The purpose of this study is to investigate the limits of the ultrasonic pulse-echo method in the frequency range between 10 MHz and 25 MHz for the measurement of the internal layer thickness in a curved multilayered polymer structure.
机译:多层结构中的各个声学薄层的厚度的测量问题已引起相当大的关注。在大多数情况下,测量的困难归因于边界的多次反射。因此通常在频域中解决问题,在频域中分析频率响应的共振结构[1]。在聚合物结构的情况下,由于高的超声波吸收和来自内部边界的弱反射,使所有层的厚度的超声波数据反转的问题变得复杂。另一个困难是受测量影响的样品曲率[2]。进行此类表征的困难源于以下事实:所接收的信号不仅取决于层的声学特性,还取决于界面的方向,形状,表面特性,位置和尺寸[3]。如果界面在超声束宽度内弯曲,则会发生超声束变形。这扭曲了所显示结构的几何形状,涂抹了分辨率,在极端情况下,可能会引起重复的图像伪影[4]。在检查具有弯曲表面的物体时,脉冲与复杂的环境相互作用,由于与对每个光谱分量的响应相关的困难,脉冲光谱分解和合成不适用。因此,多层聚合物复合材料中不同的高吸收层之间的界面不容易观察和测量。这项研究的目的是研究超声脉冲回波方法在10 MHz和25 MHz之间的频率范围内的局限性,以测量弯曲的多层聚合物结构中的内层厚度。

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